dc.contributor.author | Ceric, Hajdin | |
dc.contributor.author | Selberherr, Siegfried | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | de Orio, Roberto | |
dc.contributor.author | Croes, Kristof | |
dc.date.accessioned | 2021-10-27T07:55:16Z | |
dc.date.available | 2021-10-27T07:55:16Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32672 | |
dc.source | IIOimport | |
dc.title | Assessment of Electromigration in Nano-Interconnects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | 16th International Conference on Reliability and Stress-related Phenomena in Nano and Microelectronics - IRSP | |
dc.source.conferencedate | 4/11/2019 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | https://www.irspconference.com/schedule-and-spreakers | |
imec.availability | Published - open access | |