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A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS

dc.contributor.authorChuang, Kent
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVerbauwhede, Ingrid
dc.date.accessioned2021-10-27T08:03:47Z
dc.date.available2021-10-27T08:03:47Z
dc.date.issued2019
dc.identifier.issn0018-9200
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32713
dc.sourceIIOimport
dc.titleA physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS
dc.typeJournal article
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2765
dc.source.endpage2776
dc.source.journalIEEE Journal of Solid-State Circuits
dc.source.issue10
dc.source.volume54
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8751997
imec.availabilityPublished - open access


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