Authors

Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Linten, Dimitri; Verbauwhede, Ingrid

ISSN

0018-9200

Issue

10

Journal

IEEE Journal of Solid-State Circuits

Volume

54

Title

A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS

Publication type

Journal article

Embargo date

9999-12-31