A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS

dc.contributor.author	Chuang, Kent
dc.contributor.author	Bury, Erik
dc.contributor.author	Degraeve, Robin
dc.contributor.author	Kaczer, Ben
dc.contributor.author	Linten, Dimitri
dc.contributor.author	Verbauwhede, Ingrid
dc.contributor.imecauthor	Chuang, Kent
dc.contributor.imecauthor	Bury, Erik
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	Linten, Dimitri
dc.contributor.orcidimec	Bury, Erik::0000-0002-5847-3949
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	Linten, Dimitri::0000-0001-8434-1838
dc.date.accessioned	2021-10-27T08:03:47Z
dc.date.available	2021-10-27T08:03:47Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.issn	0018-9200
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32713
dc.identifier.url	https://ieeexplore.ieee.org/document/8751997
dc.source.beginpage	2765
dc.source.endpage	2776
dc.source.issue	10
dc.source.journal	IEEE Journal of Solid-State Circuits
dc.source.volume	54
dc.title	A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS
dc.type	Journal article
dspace.entity.type	Publication
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