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Calibrated Modeling of Line-to-Line Dielectric Reliability: LER Specs to Meet Reliability Constraints at Operating Conditions
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Calibrated Modeling of Line-to-Line Dielectric Reliability: LER Specs to Meet Reliability Constraints at Operating Conditions
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Date
2019
Meeting abstract
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44268.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ciofi, Ivan
;
Roussel, Philippe
;
Saad, Yves
;
Melvin, Lawrence
;
Wilson, Chris
;
Croes, Kristof
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Abstract
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2003
since deposited on 2021-10-27
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Acq. date: 2025-12-11
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Metrics
Views
2003
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-11
Citations