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dc.contributor.authorBrijs, Bert
dc.contributor.authorDeleu, Jeroen
dc.contributor.authorConard, Thierry
dc.contributor.authorDe Witte, Hilde
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorNakajima, K.
dc.contributor.authorKimura, K.
dc.contributor.authorGenchev, I.
dc.contributor.authorBergmaier, A.
dc.contributor.authorGoergens, I.
dc.contributor.authorNeumaier, P.
dc.contributor.authorDollinger, G.
dc.contributor.authorDobeli, M.
dc.date.accessioned2021-10-06T10:45:36Z
dc.date.available2021-10-06T10:45:36Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3271
dc.sourceIIOimport
dc.titleCharacterization of ultra thin oxynitrides, a general approach
dc.typeOral presentation
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewno
dc.source.conferenceIBA-14-ECAART-6; July 1999; Dresden, Germany.
imec.availabilityPublished - imec


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