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Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.

dc.contributor.authorCuduvally, Ramya
dc.contributor.authorOosterbos, Giel
dc.contributor.authorMorris, Richard
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorFerrari, Piero
dc.contributor.authorScheerder, Jeroen
dc.contributor.authorVantomme, Andre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-27T08:16:06Z
dc.date.available2021-10-27T08:16:06Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32766
dc.sourceIIOimport
dc.titlePost-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
dc.typeOral presentation
dc.contributor.imecauthorCuduvally, Ramya
dc.contributor.imecauthorMorris, Richard
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorScheerder, Jeroen
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecMorris, Richard::0000-0002-0902-7088
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecScheerder, Jeroen::0000-0002-9301-0392
dc.source.peerreviewno
dc.source.conferenceEuropean Atom Probe Workshop 2019
dc.source.conferencedate12/11/2019
dc.source.conferencelocationRouen France
imec.availabilityPublished - imec


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