Authors

De Coster, Jeroen; Magdziak, Rafal; De Heyn, Peter; Marinissen, Erik Jan; Pantouvaki, Marianna; Van Campenhout, Joris; Absil, Philippe; Rishavy, Dan; Frankel, Joe; Kekahuna, Kainoa; Negishi, Kazuki; Simmons, Mike; Christenson, Eric

Conference

Semiconductor Wafer Test Workshop (SWTW)

Title

A fully automatic electro-optical test system enabling the development of a silicon photonic technology platform

Publication type

Proceedings paper