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ESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results

dc.contributor.authorRuss, Christian
dc.contributor.authorGieser, H.
dc.contributor.authorVerhaege, K.
dc.date.accessioned2021-09-29T12:46:37Z
dc.date.available2021-09-29T12:46:37Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/327
dc.sourceIIOimport
dc.titleESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage457
dc.source.endpage466
dc.source.conferenceProceedings of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF); October 4-7, 199
imec.availabilityPublished - imec


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