A Bayesian approach to adaptive frequency sampling

Thumbnail
View/open
Metadata
Show full item record
Authors
De Ridder, Simon; Deschrijver, Dirk; Spina, Domenico; Dhaene, Tom; Vande Ginste, Dries
Conference
SPI2019, IEEE 23th Workshop on Signal and Power Integrity
Title
A Bayesian approach to adaptive frequency sampling
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections