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Continuous exploitative measurement trajectories using Bayesian optimisation

dc.contributor.authorDelanghe, Remi
dc.contributor.authorVan Steenkiste, Tom
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.date.accessioned2021-10-27T08:40:14Z
dc.date.available2021-10-27T08:40:14Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32859
dc.sourceIIOimport
dc.titleContinuous exploitative measurement trajectories using Bayesian optimisation
dc.typeMeeting abstract
dc.contributor.imecauthorDelanghe, Remi
dc.contributor.imecauthorVan Steenkiste, Tom
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conferenceBENELEARN2019, the annual Belgian-Dutch Conference on Machine Learning
dc.source.conferencedate6/11/2019
dc.source.conferencelocationBrussel Belgium
imec.availabilityPublished - open access


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