dc.contributor.author | Buda, M. | |
dc.contributor.author | Iordache, G. | |
dc.contributor.author | Acket, G. A. | |
dc.contributor.author | van de Roer, T. G. | |
dc.contributor.author | van Roy, B. H. | |
dc.contributor.author | Smalbrugge, E. | |
dc.contributor.author | Kaufmann, L. M. F. | |
dc.contributor.author | Moerman, Ingrid | |
dc.contributor.author | Sys, Carl | |
dc.date.accessioned | 2021-10-06T10:46:53Z | |
dc.date.available | 2021-10-06T10:46:53Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3285 | |
dc.source | IIOimport | |
dc.title | Esitmation of stress-induced antiguiding by the anodic oxide covering the sides of the ridge waveguide laser diode | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Moerman, Ingrid | |
dc.contributor.orcidimec | Moerman, Ingrid::0000-0003-2377-3674 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | Semiconductor and Integrated Optoelectronics - SIOE | |
dc.source.conferencedate | 07/04/1999 | |
dc.source.conferencelocation | Cardiff UK | |
imec.availability | Published - open access | |