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Understanding the origin of Voc and FF loss after co-plating of bifacial cells: an in-depth microstructure study

dc.contributor.authorDepauw, Valerie
dc.contributor.authorRussell, Richard
dc.contributor.authorSingh, Sukhvinder
dc.contributor.authorRecaman Payo, Maria
dc.contributor.authorAleman, Monica
dc.contributor.authorJambaldinni, Shruti
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorGordon, Ivan
dc.contributor.authorSzlufcik, Jozef
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-27T08:42:56Z
dc.date.available2021-10-27T08:42:56Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32869
dc.sourceIIOimport
dc.titleUnderstanding the origin of Voc and FF loss after co-plating of bifacial cells: an in-depth microstructure study
dc.typeProceedings paper
dc.contributor.imecauthorDepauw, Valerie
dc.contributor.imecauthorSingh, Sukhvinder
dc.contributor.imecauthorRecaman Payo, Maria
dc.contributor.imecauthorAleman, Monica
dc.contributor.imecauthorJambaldinni, Shruti
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecDepauw, Valerie::0000-0003-2045-9698
dc.contributor.orcidimecSingh, Sukhvinder::0000-0003-1985-0534
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewyes
dc.source.conferenceSiliconPV 2019
dc.source.conferencedate8/04/2019
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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