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Low voltage transient RESET kinetic modeling of OxRRAM for neuromorphic applications

dc.contributor.authorDoevenspeck, Jonas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorDebacker, Peter
dc.contributor.authorVerkest, Diederik
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-27T08:54:51Z
dc.date.available2021-10-27T08:54:51Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32908
dc.sourceIIOimport
dc.titleLow voltage transient RESET kinetic modeling of OxRRAM for neuromorphic applications
dc.typeProceedings paper
dc.contributor.imecauthorDoevenspeck, Jonas
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conference2019 IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720555
imec.availabilityPublished - open access


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