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Investigation into socketed CDM (SDM) tester parasitics

dc.contributor.authorChaine, M.
dc.contributor.authorVerhaege, K.
dc.contributor.authorAvery, L.
dc.contributor.authorKelly, M.
dc.contributor.authorGieser, H.
dc.contributor.authorBock, Karlheinz
dc.contributor.authorHenry, L. G.
dc.contributor.authorMeuse, T.
dc.contributor.authorBrodbeck, T.
dc.contributor.authorBarth, J.
dc.date.accessioned2021-10-06T10:47:47Z
dc.date.available2021-10-06T10:47:47Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3294
dc.sourceIIOimport
dc.titleInvestigation into socketed CDM (SDM) tester parasitics
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1531
dc.source.endpage1540
dc.source.journalMicroelectronics and Reliability
dc.source.issue11
dc.source.volume39
imec.availabilityPublished - imec


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