Investigation into socketed CDM (SDM) tester parasitics

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Authors

Chaine, M.; Verhaege, K.; Avery, L.; Kelly, M.; Gieser, H.; Bock, Karlheinz; Henry, L. G.; Meuse, T.; Brodbeck, T.; Barth, J.

Issue

11

Journal

Microelectronics and Reliability

Volume

39

Title

Investigation into socketed CDM (SDM) tester parasitics

Publication type

Journal article

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