Publication:

Investigation into socketed CDM (SDM) tester parasitics

Date

1999
Journal article
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Author(s)

Chaine, M.
;
Verhaege, K.
;
Avery, L.
;
Kelly, M.
;
Gieser, H.
;
Bock, Karlheinz
;
Henry, L. G.
;
Meuse, T.
;
Brodbeck, T.
;
Barth, J.

Journal

Microelectronics and Reliability

Abstract

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1977 since deposited on 2021-10-06
Acq. date: 2026-02-25

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1977 since deposited on 2021-10-06
Acq. date: 2026-02-25

Citations