Publication:
Investigation into socketed CDM (SDM) tester parasitics
Date
| dc.contributor.author | Chaine, M. | |
| dc.contributor.author | Verhaege, K. | |
| dc.contributor.author | Avery, L. | |
| dc.contributor.author | Kelly, M. | |
| dc.contributor.author | Gieser, H. | |
| dc.contributor.author | Bock, Karlheinz | |
| dc.contributor.author | Henry, L. G. | |
| dc.contributor.author | Meuse, T. | |
| dc.contributor.author | Brodbeck, T. | |
| dc.contributor.author | Barth, J. | |
| dc.date.accessioned | 2021-10-06T10:47:47Z | |
| dc.date.available | 2021-10-06T10:47:47Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3294 | |
| dc.source.beginpage | 1531 | |
| dc.source.endpage | 1540 | |
| dc.source.issue | 11 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 39 | |
| dc.title | Investigation into socketed CDM (SDM) tester parasitics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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