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Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts

dc.contributor.authorFirat, Meric
dc.contributor.authorRecaman Payo, Maria
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorLuchies, Jan-Marc
dc.contributor.authorLenes, Martijn
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-27T09:14:21Z
dc.date.available2021-10-27T09:14:21Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32966
dc.sourceIIOimport
dc.titleCharacterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts
dc.typeProceedings paper
dc.contributor.imecauthorFirat, Meric
dc.contributor.imecauthorRecaman Payo, Maria
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecFirat, Meric::0000-0002-6509-9668
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage40004
dc.source.conferenceSiliconPV 2019, the 9th International Conference on Crystalline Silicon Photovoltaics
dc.source.conferencedate8/04/2019
dc.source.conferencelocationLeuven Belgium
dc.identifier.urlhttps://aip.scitation.org/doi/abs/10.1063/1.5123831
imec.availabilityPublished - open access
imec.internalnotesAIP Conference Proceedings; Vol. 2147


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