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Characterization of losses due to absorption in rear-side N-type poly-Si passivating contacts

dc.contributor.authorFirat, Meric
dc.contributor.authorRecaman Payo, Maria
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorLuchies, Jan-Marc
dc.contributor.authorLenes, Martijn
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-27T09:14:41Z
dc.date.available2021-10-27T09:14:41Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32967
dc.sourceIIOimport
dc.titleCharacterization of losses due to absorption in rear-side N-type poly-Si passivating contacts
dc.typeOral presentation
dc.contributor.imecauthorFirat, Meric
dc.contributor.imecauthorRecaman Payo, Maria
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecFirat, Meric::0000-0002-6509-9668
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.conferenceSiliconFOREST 2019
dc.source.conferencedate24/02/2019
dc.source.conferencelocationFeldberg-Falkau Germany
imec.availabilityPublished - imec


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