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Conference contributions
Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistors
Publication:
Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistors
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Date
1999
Meeting abstract
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3262.pdf
354.51 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
;
Mohammadzadeh, A.
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Abstract
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1943
since deposited on 2021-10-06
Acq. date: 2025-12-09
Citations
Metrics
Views
1943
since deposited on 2021-10-06
Acq. date: 2025-12-09
Citations