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Application of cell-aware test on an advanced 3nm CMOS standard-cell library

dc.contributor.authorGao, Zhan
dc.contributor.authorHu, Min-Chun
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorMalagi, Santosh
dc.contributor.authorSwenton, Joe
dc.contributor.authorHuisken, Jos
dc.contributor.authorGoossens, Kees
dc.date.accessioned2021-10-27T09:29:22Z
dc.date.available2021-10-27T09:29:22Z
dc.date.issued2019-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33008
dc.sourceIIOimport
dc.titleApplication of cell-aware test on an advanced 3nm CMOS standard-cell library
dc.typeProceedings paper
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceCDNLive EMEA 2019
dc.source.conferencedate6/05/2019
dc.source.conferencelocationMunich Germany
imec.availabilityPublished - imec


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