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Defect location identification for cell-aware test

dc.contributor.authorGao, Zhan
dc.contributor.authorMalagi, Santosh S.
dc.contributor.authorSwenton, Joe
dc.contributor.authorHuisken, Jos
dc.contributor.authorGoossens, Kees
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-27T09:30:28Z
dc.date.available2021-10-27T09:30:28Z
dc.date.issued2019-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33011
dc.sourceIIOimport
dc.titleDefect location identification for cell-aware test
dc.typeProceedings paper
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.conferenceIEEE International Test Conference India (ITC-India) 2019
dc.source.conferencedate21/07/2019
dc.source.conferencelocationBengaluru India
imec.availabilityPublished - imec


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