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Defect-location identification for cell-aware test

dc.contributor.authorGao, Zhan
dc.contributor.authorMalagi, Santosh
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorSwenton, Joe
dc.contributor.authorHuisken, Jos
dc.contributor.authorGoossens, Kees
dc.date.accessioned2021-10-27T09:30:49Z
dc.date.available2021-10-27T09:30:49Z
dc.date.issued2019-03
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33012
dc.sourceIIOimport
dc.titleDefect-location identification for cell-aware test
dc.typeProceedings paper
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conferenceIEEE Latin-American Test Symposium (LATS'19)
dc.source.conferencedate11/03/2019
dc.source.conferencelocationSantiago Chili
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8704561
imec.availabilityPublished - imec
imec.internalnotesLATS 2019 Best Paper Award


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