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Focused light on thin-films revisited: analytical results for parallel and tilted apertures

dc.contributor.authorGoossens, Thomas
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-27T09:44:47Z
dc.date.available2021-10-27T09:44:47Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33049
dc.sourceIIOimport
dc.titleFocused light on thin-films revisited: analytical results for parallel and tilted apertures
dc.typeProceedings paper
dc.contributor.imecauthorGoossens, Thomas
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.source.peerreviewyes
dc.source.beginpageTC.8
dc.source.conferenceOSA Optical Interference Coatings 2019
dc.source.conferencedate2/06/2019
dc.source.conferencelocationAlbuquerque, NM USA
dc.identifier.urlhttps://doi.org/10.1364/OIC.2019.TC.8
imec.availabilityPublished - imec


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