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A bio-impedance readout IC with digital-assisted baseline cancellation for 2-electrode measurement

dc.contributor.authorHa, Hyunsoo
dc.contributor.authorSijbers, Wim
dc.contributor.authorVan Wegberg, Roland
dc.contributor.authorXu, Jiawei
dc.contributor.authorKonijnenburg, Mario
dc.contributor.authorVis, Peter
dc.contributor.authorBreeschoten, Arjan
dc.contributor.authorSong, Shuang
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorVan Helleputte, Nick
dc.date.accessioned2021-10-27T09:53:40Z
dc.date.available2021-10-27T09:53:40Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33071
dc.sourceIIOimport
dc.titleA bio-impedance readout IC with digital-assisted baseline cancellation for 2-electrode measurement
dc.typeProceedings paper
dc.contributor.imecauthorSijbers, Wim
dc.contributor.imecauthorVan Wegberg, Roland
dc.contributor.imecauthorKonijnenburg, Mario
dc.contributor.imecauthorVis, Peter
dc.contributor.imecauthorBreeschoten, Arjan
dc.contributor.imecauthorSong, Shuang
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorVan Helleputte, Nick
dc.contributor.orcidimecSijbers, Wim::0000-0003-2015-785X
dc.contributor.orcidimecKonijnenburg, Mario::0000-0001-8016-0888
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.contributor.orcidimecVan Helleputte, Nick::0000-0002-7511-1923
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage368
dc.source.endpage369
dc.source.conference2019 IEEE International Solid-State Circuits Conference - ISSCC
dc.source.conferencedate17/02/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8662433
imec.availabilityPublished - open access


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