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Low frequency noise characterisation of submicron vertical heterojunction MESFETs

dc.contributor.authorCollaert, Nadine
dc.contributor.authorVerheyen, P.
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-06T10:49:24Z
dc.date.available2021-10-06T10:49:24Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3309
dc.sourceIIOimport
dc.titleLow frequency noise characterisation of submicron vertical heterojunction MESFETs
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.beginpage308
dc.source.endpage311
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
imec.availabilityPublished - imec


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