dc.contributor.author | Hatem, Firas Odai Hatem | |
dc.contributor.author | Chai, Z. | |
dc.contributor.author | Zhang, Wei | |
dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Garbin, Daniele | |
dc.contributor.author | Robertson, J. | |
dc.contributor.author | Guo, Y, | |
dc.contributor.author | Zhang, J.F. | |
dc.contributor.author | Marsland, John | |
dc.contributor.author | Freitas, Pedro | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2021-10-27T10:07:38Z | |
dc.date.available | 2021-10-27T10:07:38Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33107 | |
dc.source | IIOimport | |
dc.title | Endurance improvement of more than five orders in GexSe1-x OTS selectors by using a novel refreshing scheme | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Garbin, Daniele | |
dc.contributor.imecauthor | Freitas, Pedro | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Garbin, Daniele::0000-0002-5884-1043 | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 827 | |
dc.source.endpage | 830 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM 2019 | |
dc.source.conferencedate | 7/12/2019 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |