dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Kondoh, Eiichi | |
dc.contributor.author | De Witte, Hilde | |
dc.contributor.author | Maex, Karen | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-06T10:49:53Z | |
dc.date.available | 2021-10-06T10:49:53Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3313 | |
dc.source | IIOimport | |
dc.title | X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface | |
dc.type | Journal article | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1244 | |
dc.source.endpage | 1249 | |
dc.source.journal | J. Vacuum Science and Technology A | |
dc.source.issue | 4 | |
dc.source.volume | 17 | |
imec.availability | Published - imec | |