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New insights into the imprint effect in FE-HfO and its recovery

dc.contributor.authorHigashi, Yusuke
dc.contributor.authorFlorent, Karine
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorKaczer, Ben
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorClima, Sergiu
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorMcMitchell, Sean
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorCelano, Umberto
dc.contributor.authorSuzuki, Masamichi
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-27T10:28:21Z
dc.date.available2021-10-27T10:28:21Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33159
dc.sourceIIOimport
dc.titleNew insights into the imprint effect in FE-HfO and its recovery
dc.typeProceedings paper
dc.contributor.imecauthorHigashi, Yusuke
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorMcMitchell, Sean
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorSuzuki, Masamichi
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage7
dc.source.conference2019 IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720553
imec.availabilityPublished - open access


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