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Innovating SRAM design and test program for fast process related defect recognition and failure analysis

dc.contributor.authorCoppens, P.
dc.contributor.authorVanhorebeek, Guido
dc.contributor.authorDe Backer, E.
dc.contributor.authorYuan, Xiao Jie
dc.date.accessioned2021-10-06T10:50:09Z
dc.date.available2021-10-06T10:50:09Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3315
dc.sourceIIOimport
dc.titleInnovating SRAM design and test program for fast process related defect recognition and failure analysis
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage290
dc.source.endpage297
dc.source.conferenceIn-Line Methods and Monitors for Process and Yield Improvement
dc.source.conferencedate22/09/1999
dc.source.conferencelocationSanta Clara, CA USA
imec.availabilityPublished - open access


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