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Innovating SRAM design for fast process related defect recognition and failure analysis

dc.contributor.authorCoppens, P.
dc.contributor.authorVanhorebeek, Guido
dc.contributor.authorDe Backer, E.
dc.contributor.authorYuan, Xiao Jie
dc.date.accessioned2021-10-06T10:50:15Z
dc.date.available2021-10-06T10:50:15Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3316
dc.sourceIIOimport
dc.titleInnovating SRAM design for fast process related defect recognition and failure analysis
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage220
dc.source.endpage223
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference
dc.source.conferencedate13/09/1999
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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