Show simple item record

An enhanced differential surface admittance operator for the signal integrity modeling of interconnects

dc.contributor.authorHuynen, Martijn
dc.contributor.authorKapusuz, Kamil Yavuz
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-27T10:41:06Z
dc.date.available2021-10-27T10:41:06Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33188
dc.sourceIIOimport
dc.titleAn enhanced differential surface admittance operator for the signal integrity modeling of interconnects
dc.typeProceedings paper
dc.contributor.imecauthorHuynen, Martijn
dc.contributor.imecauthorKapusuz, Kamil Yavuz
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecHuynen, Martijn::0000-0002-5168-9421
dc.contributor.orcidimecKapusuz, Kamil Yavuz::0000-0003-0414-9147
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conferenceICEAA2019, International Conference on Electromagnetics in Advanced Applications
dc.source.conferencedate9/09/2019
dc.source.conferencelocationGranada Spain
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-7281-0563-5


Files in this item

Thumbnail
Name:
43891.pdf
Size:
444.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record