Impact of the generation width on the lifetime extraction in Cz silicon p-n junctions

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Authors
Czerwinski, A.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor
Conference
Defects in Silicon III
Title
Impact of the generation width on the lifetime extraction in Cz silicon p-n junctions
Publication type
Proceedings paper
Embargo date
9999-12-31
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