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Parameter extraction, variability analysis and yield prediction of the photonic integrated circuits

dc.contributor.authorKhan, Muhammad Umar
dc.contributor.authorXing, Yufei
dc.contributor.authorBogaerts, Wim
dc.date.accessioned2021-10-27T11:24:00Z
dc.date.available2021-10-27T11:24:00Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33285
dc.sourceIIOimport
dc.titleParameter extraction, variability analysis and yield prediction of the photonic integrated circuits
dc.typeProceedings paper
dc.contributor.imecauthorKhan, Muhammad Umar
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecKhan, Muhammad Umar::0000-0001-5760-7485
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageIM3A.2
dc.source.conferenceOSA Advanced Photonics Congress
dc.source.conferencedate29/07/2019
dc.source.conferencelocationBurlingame, CA USA
dc.identifier.urlhttps://www.osapublishing.org/abstract.cfm?uri=IPRSN-2019-IM3A.2
imec.availabilityPublished - open access


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