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On the basic correlation between polysilicon resistor linearity, matching and 1/f noise

dc.contributor.authorDa Rold, Martina
dc.contributor.authorVan Huylenbroeck, Stefaan
dc.contributor.authorKnuts, Bruno
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-06T10:51:49Z
dc.date.available2021-10-06T10:51:49Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3329
dc.sourceIIOimport
dc.titleOn the basic correlation between polysilicon resistor linearity, matching and 1/f noise
dc.typeProceedings paper
dc.contributor.imecauthorVan Huylenbroeck, Stefaan
dc.contributor.imecauthorKnuts, Bruno
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecVan Huylenbroeck, Stefaan::0000-0001-9978-3575
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage648
dc.source.endpage651
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
imec.availabilityPublished - imec


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