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Methodology for application-dependent degradation analysis of memory timing

dc.contributor.authorKraak, Daniel
dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-27T11:44:29Z
dc.date.available2021-10-27T11:44:29Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33327
dc.sourceIIOimport
dc.titleMethodology for application-dependent degradation analysis of memory timing
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage162
dc.source.endpage167
dc.source.conference22nd ACM/IEEE Design, Automation and Test in Europe Conference (DATE)
dc.source.conferencedate2/03/2019
dc.source.conferencelocationFlorence Italy
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8715143
imec.availabilityPublished - open access


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