Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Metal barrier induced damage in self-assembly based organosilica low-k dielectrics and its reduction by organic template residues
Publication:
Metal barrier induced damage in self-assembly based organosilica low-k dielectrics and its reduction by organic template residues
Copy permalink
Date
2019
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krishtab, Mikhail
;
de Marneffe, Jean-Francois
;
Armini, Silvia
;
Meersschaut, Johan
;
Bender, Hugo
;
Wilson, Chris
;
De Gendt, Stefan
Journal
Applied Surface Science
Abstract
Description
Metrics
Views
1800
since deposited on 2021-10-27
Acq. date: 2026-01-10
Citations
Metrics
Views
1800
since deposited on 2021-10-27
Acq. date: 2026-01-10
Citations