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Statistical significance of STEM based metrology on advanced 3D transistor structures
Publication:
Statistical significance of STEM based metrology on advanced 3D transistor structures
Date
2019
Proceedings Paper
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41321.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kwakman, Laurens
;
Kenslea, Anne
;
Johanesen, Hayley
;
Strauss, Michael
;
Boullart, Werner
;
Mertens, Hans
;
Siew, Yong Kong
;
Barla, Kathy
Journal
Abstract
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Views
1830
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations
Metrics
Views
1830
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations