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Accelerated device degradation analysis on high speed Ge waveguide photodetectors

dc.contributor.authorLesniewska, Alicja
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorCroes, Kristof
dc.date.accessioned2021-10-27T12:24:44Z
dc.date.available2021-10-27T12:24:44Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33411
dc.sourceIIOimport
dc.titleAccelerated device degradation analysis on high speed Ge waveguide photodetectors
dc.typeMeeting abstract
dc.contributor.imecauthorLesniewska, Alicja
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecLesniewska, Alicja::0000-0003-3863-065X
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.source.peerreviewyes
dc.source.conference2019 IEEE International Reliability Phyics Symposium - IRPS
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720610
imec.availabilityPublished - imec


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