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Wafer level thin film image sensor integration

dc.contributor.authorLi, Yunlong
dc.contributor.authorCheyns, David
dc.contributor.authorMoreno Hagelsieb, Luis
dc.contributor.authorGeorgitzikis, Epimitheas
dc.contributor.authorLim, Myung jin
dc.contributor.authorMao, Ming
dc.contributor.authorBoulenc, Pierre
dc.contributor.authorLee, Jiwon
dc.contributor.authorMalinowski, Pawel
dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorGuerrieri, Stefano
dc.date.accessioned2021-10-27T12:38:37Z
dc.date.available2021-10-27T12:38:37Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33438
dc.sourceIIOimport
dc.titleWafer level thin film image sensor integration
dc.typeMeeting abstract
dc.contributor.imecauthorLi, Yunlong
dc.contributor.imecauthorCheyns, David
dc.contributor.imecauthorMoreno Hagelsieb, Luis
dc.contributor.imecauthorGeorgitzikis, Epimitheas
dc.contributor.imecauthorLim, Myung jin
dc.contributor.imecauthorMao, Ming
dc.contributor.imecauthorBoulenc, Pierre
dc.contributor.imecauthorLee, Jiwon
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.contributor.orcidimecCheyns, David::0000-0002-1327-8752
dc.contributor.orcidimecGeorgitzikis, Epimitheas::0000-0001-5972-8328
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.contributor.orcidimecMoreno Hagelsieb, Luis::0000-0002-9724-6597
dc.contributor.orcidimecLim, Myung jin::0000-0002-0126-1793
dc.source.peerreviewyes
dc.source.conferenceWorkshop Space & Scientific CMOS Image Sensors
dc.source.conferencedate26/11/2019
dc.source.conferencelocationToulouse France
imec.availabilityPublished - imec


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