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Low-frequency noise in InGaZnO thin-film transistors with Al2O3 gate dielectric

dc.contributor.authorLondono Ramirez, Horacio
dc.contributor.authorChien, Yu-Chieh
dc.contributor.authorHoffman, Luis
dc.contributor.authorNag, Manoj
dc.contributor.authorHaesler, Sebastian
dc.contributor.authorSteudel, Soeren
dc.contributor.authorGenoe, Jan
dc.date.accessioned2021-10-27T12:55:00Z
dc.date.available2021-10-27T12:55:00Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33470
dc.sourceIIOimport
dc.titleLow-frequency noise in InGaZnO thin-film transistors with Al2O3 gate dielectric
dc.typeProceedings paper
dc.contributor.imecauthorLondono Ramirez, Horacio
dc.contributor.imecauthorHoffman, Luis
dc.contributor.imecauthorNag, Manoj
dc.contributor.imecauthorHaesler, Sebastian
dc.contributor.imecauthorSteudel, Soeren
dc.contributor.imecauthorGenoe, Jan
dc.contributor.orcidimecLondono Ramirez, Horacio::0000-0003-3456-8975
dc.contributor.orcidimecHoffman, Luis::0000-0002-1489-3669
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHoffman, Diego::0000-0002-1489-3669
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage84
dc.source.conference25th International Conference on Noise and Fluctuations - ICNF 2019
dc.source.conferencedate18/06/2019
dc.source.conferencelocationNeuchatel Switzerland
dc.identifier.urlhttps://infoscience.epfl.ch/record/269292/files/ICNF_2019_Full_Paper_84.pdf
imec.availabilityPublished - imec


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