dc.contributor.author | Malinowski, Pawel | |
dc.contributor.author | Georgitzikis, Epimitheas | |
dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Boulenc, Pierre | |
dc.contributor.author | Frazzica, Fortunato | |
dc.contributor.author | Cavaco, Celso | |
dc.contributor.author | Guerrieri, Stefano | |
dc.contributor.author | Maes, Jorick | |
dc.contributor.author | Hens, Zeger | |
dc.contributor.author | Gielen, Sam | |
dc.contributor.author | Verstraeten, Frederik | |
dc.contributor.author | Verstappen, Pieter | |
dc.contributor.author | Maes, Wouter | |
dc.contributor.author | Heremans, Paul | |
dc.contributor.author | Cheyns, David | |
dc.date.accessioned | 2021-10-27T13:22:54Z | |
dc.date.available | 2021-10-27T13:22:54Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33522 | |
dc.source | IIOimport | |
dc.title | NIR/SWIR monolithic image sensors enabled by thin-film photodiode stacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Malinowski, Pawel | |
dc.contributor.imecauthor | Georgitzikis, Epimitheas | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Boulenc, Pierre | |
dc.contributor.imecauthor | Frazzica, Fortunato | |
dc.contributor.imecauthor | Cavaco, Celso | |
dc.contributor.imecauthor | Gielen, Sam | |
dc.contributor.imecauthor | Verstraeten, Frederik | |
dc.contributor.imecauthor | Verstappen, Pieter | |
dc.contributor.imecauthor | Maes, Wouter | |
dc.contributor.imecauthor | Heremans, Paul | |
dc.contributor.imecauthor | Cheyns, David | |
dc.contributor.orcidimec | Malinowski, Pawel::0000-0002-2934-470X | |
dc.contributor.orcidimec | Georgitzikis, Epimitheas::0000-0001-5972-8328 | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Cavaco, Celso::0000-0001-9079-338X | |
dc.contributor.orcidimec | Heremans, Paul::0000-0003-2151-1718 | |
dc.contributor.orcidimec | Cheyns, David::0000-0002-1327-8752 | |
dc.contributor.orcidimec | Maes, Wouter::0000-0001-7883-3393 | |
dc.source.peerreview | no | |
dc.source.conference | SPIE Optics+Photonics 2019 | |
dc.source.conferencedate | 11/08/2019 | |
dc.source.conferencelocation | San Diego USA | |
imec.availability | Published - imec | |