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Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd

dc.contributor.authorManut, Azrif
dc.contributor.authorGao, Rui
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorJi, Zhigang
dc.contributor.authorMehedi, Mehzabeen
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorVigar, David
dc.contributor.authorAsenov, Asen
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-27T13:26:52Z
dc.date.available2021-10-27T13:26:52Z
dc.date.issued2019
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33529
dc.sourceIIOimport
dc.titleTrigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1482
dc.source.endpage1488
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue3
dc.source.volume66
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8636514
imec.availabilityPublished - open access


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