Authors

Manut, Azrif; Gao, Rui; Zhang, Jian Fu; Ji, Zhigang; Mehedi, Mehzabeen; Zhang, Wei Dong; Vigar, David; Asenov, Asen; Kaczer, Ben

ISSN

0018-9383

Issue

3

Journal

IEEE Transactions on Electron Devices

Volume

66

Title

Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd

Publication type

Journal article

Embargo date

9999-12-31