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Articles
Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
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Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Manut, Azrif
;
Gao, Rui
;
Zhang, Jian Fu
;
Ji, Zhigang
;
Mehedi, Mehzabeen
;
Zhang, Wei Dong
;
Vigar, David
;
Asenov, Asen
;
Kaczer, Ben
Journal
IEEE Transactions on Electron Devices
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1959
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations
Metrics
Views
1959
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations