Machine-learning-based error detection and design optimization in signal integrity applications

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Author(s)

Medico, Roberto

;

Spina, Domenico

;

Vande Ginste, Dries

;

Deschrijver, Dirk

;

Journal

IEEE Transactions on Components, Packaging and Manufacturing Technology

Metrics

2081 since deposited on 2021-10-27

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Acq. date: 2025-11-06