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Machine-learning-based error detection and design optimization in signal integrity applications

dc.contributor.authorMedico, Roberto
dc.contributor.authorSpina, Domenico
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.date.accessioned2021-10-27T13:46:05Z
dc.date.available2021-10-27T13:46:05Z
dc.date.issued2019-09
dc.identifier.issn2156-3950
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33563
dc.sourceIIOimport
dc.titleMachine-learning-based error detection and design optimization in signal integrity applications
dc.typeJournal article
dc.contributor.imecauthorMedico, Roberto
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1712
dc.source.endpage1720
dc.source.journalIEEE Transactions on Components, Packaging and Manufacturing Technology
dc.source.issue9
dc.source.volume9
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8715394
imec.availabilityPublished - open access


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