Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization
dc.contributor.author | Moens, P. | |
dc.contributor.author | Constant, A. | |
dc.contributor.author | Stockman, Arno | |
dc.contributor.author | Franchi, J. | |
dc.contributor.author | Allerstam, F. | |
dc.date.accessioned | 2021-10-27T14:05:52Z | |
dc.date.available | 2021-10-27T14:05:52Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33599 | |
dc.source | IIOimport | |
dc.title | Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Stockman, Arno | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) | |
dc.source.conferencedate | 19/05/2019 | |
dc.source.conferencelocation | Shanghai China | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8757560 | |
imec.availability | Published - open access |