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A physical-statistical approach to AlGaN/GaN HEMT reliability

dc.contributor.authorMoens, P.
dc.contributor.authorStockman, Arno
dc.date.accessioned2021-10-27T14:06:22Z
dc.date.available2021-10-27T14:06:22Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33600
dc.sourceIIOimport
dc.titleA physical-statistical approach to AlGaN/GaN HEMT reliability
dc.typeProceedings paper
dc.contributor.imecauthorStockman, Arno
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference2019 IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey CA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720521
imec.availabilityPublished - open access


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