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Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs

dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-06T10:55:53Z
dc.date.available2021-10-06T10:55:53Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3361
dc.sourceIIOimport
dc.titlePhysics based accurate extraction of Leff and Rs for deep submicron MOSFETs
dc.typeOral presentation
dc.contributor.imecauthorDe Meyer, Kristin
dc.source.peerreviewno
dc.source.conferenceAACD - Advances in Analog Circuit Design; 23-25 March 1999; Opio, France.
imec.availabilityPublished - imec


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